871 Series Laser Wavelength Meter

The 871 Series Laser Wavelength Meter uses a proven Fizeau etalon-based design to measure the wavelength of both pulsed and CW lasers that operate from 375 nm to 2.5 μm.

The model 871A is the most precise, measuring wavelength to an accuracy of ± 0.2 parts per million (± 0.0001 nm at 500 nm). For experiments that are less exacting, the model 871B is a lower-priced alternative with an accuracy of ± 0.75 parts per million (± 0.001 nm at 1500 nm).

Automatic calibration with a built-in wavelength standard guarantees this performance to ensure the most meaningful experimental results.

The Fizeau etalons of the 871 Laser Wavelength Meter generate a spatial interferogram that is detected by a fast photodetector array. An on-board digital signal processor quickly converts the interferometric data to wavelength. Because this calculation is done within the instrument, a sustained measurement rate as high as 1 kHz is achieved.

The 871 Laser Wavelength Meter can measure the wavelength of every pulse of a laser that operates at repetition rates of ≤ 1 kHz. At higher repetition rates, the system integrates all laser pulses that arrive within the measurement window. In addition, the system’s time resolution of 1 ms provides the most detailed wavelength characterization of tunable lasers and fast feedback for laser wavelength stabilization.

The 871 Laser Wavelength Meter operates with a PC connected directly by USB or through a local area network via Ethernet. Software is provided to control measurement parameters and to report wavelength data.

Since wavelength is calculated using an on-board digital signal processor, the 871 Laser Wavelength Meter can be integrated directly into an experiment using a library of commands for custom or LabVIEW programming. This eliminates the need for a dedicated PC and enables the use of any operating system.