Wafers require exacting thickness tolerances for semiconductor performance. Bristol Instruments non-contact optical thickness gauges measure Si, GaN and other semiconductor material with sub-micron accuracy.
- Non-contact technique means no damage or deformation
- 1.3 micron source allows imaging of material opaque to visible light
- Real time results for fast testing throughput
- QC Mode in Opti-Cal software ensures mistake free measurements for engineering, QC and production personnel
Measurement results shown in table below are of a typical semiconductor sample, displayed in Bristol's Opti-Cal software. Green boxes show the wafer is within spec. It would be red if it were out of tolerance.