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Wafers require exacting thickness tolerances for semiconductor performance. Bristol Instruments non-contact optical thickness gauges measure Si, GaN and other semiconductor material with sub-micron accuracy.

integrated microchip
  • Non-contact technique means no damage or deformation
  • 1.3 micron source allows imaging of material opaque to visible light
  • Real time results for fast testing throughput
  • QC Mode in Opti-Cal software ensures mistake free measurements for engineering, QC and production personnel

Measurement results shown in table below are of a typical semiconductor sample, displayed in Bristol's Opti-Cal software. Green boxes show the wafer is within spec.  It would be red if it were out of tolerance.

GaN Wafer Screenshot

Are you looking for fast, accurate measurement of your Si, GaN, or other semiconductor material?

Contact us today for a virtual demonstration!