Bristol Instruments, Inc.

    P: (585) 924-2620

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    Bristol Instruments is a world leader in optical interferometer-based instrumentation. Its proven Michelson interferometer and Fizeau etalon technologies ensure that its products provide reliably accurate measurements for scientists and engineers who are involved in scientific research, fiber communications, and optical metrology. Bristol's flagship products accurately characterize the wavelength...

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    Bristol Instruments offers a variety of optical interferometer-based products for scientists and engineers who are interested in Laser Spectral Characterization, WDM Wavelength Testing, or Non-Contact Thickness Measurement. Wavelength meters and spectrum analyzers are available to characterize CW and pulsed lasers that operate from the visible to the mid-IR. The wavelength of WDM lasers and WDM signals can be measured with a family of...

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    Bristol Instruments, Inc., located near Rochester, NY, was founded in 2005 by three technical and marketing leaders of the now-defunct Burleigh Instruments. Together, this group has over 75 years of combined experience in the design, manufacture, and marketing of lasers and precision test instruments used in basic and applied research, engineering, and production test applications...

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    Upcoming Events

    Frontiers in Optics | Laser Science

    October 19-20, 2016
    Booth # 202
    Rochester Riverside Convention Center

    BIOMEDevice San Jose

    December 7-8, 2016
    Booth # 434
    San Jose McEnery Convention Center
    San Jose, CA

    Latest News

    June 2, 2016 - Bristol Instruments Improves the Speed of Its Highest Accuracy Optical Wavelength Meter
    The 228A Series Optical Wavelength Meter now measures absolute wavelength to an accuracy of ± 0.3 pm in only 0.1 seconds.

    February 17, 2016 - Bristol Instruments Improves its Laser Spectral Analysis Capability
    The 771 Series Laser Spectrum Analyzer combines exceptional wavelength accuracy, spectral resolution, and optical rejection ratio for the most detailed spectral characterization available.

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